About us
ALES, short for Atomic Level Emission Source, represents the core technology of our company: Single-Atom Tip (SAT) technology.
ALES, short for Atomic Level Emission Source, represents the core technology of our company: Single-Atom Tip (SAT) technology.
After world-renowned field emission expert Academician Tien-Tzou Tsong brought this technology back to Taiwan from the United States, he established the Surface Science Laboratory at the Institute of Physics, Academia Sinica, where it was developed and refined for over three decades. One of its most significant scientific achievements is the invention of the SAT.
After world-renowned field emission expert Academician Tien-Tzou Tsong brought this technology back to Taiwan from the United States, he established the Surface Science Laboratory at the Institute of Physics, Academia Sinica, where it was developed and refined for over three decades. One of its most significant scientific achievements is the invention of the SAT.
The SAT can be used for field emission of electron or ion beams. As an atomic level electron or ion source, it offers the highest brightness and is one of the most advanced charged particle beam technologies in the world, greatly enhancing the resolution of semiconductor-related manufacturing and inspection equipment.
The SAT can be used for field emission of electron or ion beams. As an atomic level electron or ion source, it offers the highest brightness and is one of the most advanced charged particle beam technologies in the world, greatly enhancing the resolution of semiconductor-related manufacturing and inspection equipment.
For over a decade, numerous globally renowned focused ion beam (FIB) system manufacturers have sought collaborations with the Institute of Physics, Academia Sinica to co-develop next-generation FIB systems with single-atom ion sources. However, the gap between scientific research and the development of fully commercialized systems has proven challenging. After evaluations and preliminary tests, these collaborations were unable to advance to full-scale development. In light of this, Dr. Wei-Tse Chang, founder of ALES Tech, decided in June 2019 to leave the Institute of Physics after nearly a decade of service. He established ALES Tech Inc. and obtained a patent license for the SAT technology from Academia Sinica. ALES Tech took on the task of commercializing the single-atom ion source to accelerate the development of next-generation FIB systems.
For over a decade, numerous globally renowned focused ion beam (FIB) system manufacturers have sought collaborations with the Institute of Physics, Academia Sinica to co-develop next-generation FIB systems with single-atom ion sources. However, the gap between scientific research and the development of fully commercialized systems has proven challenging. After evaluations and preliminary tests, these collaborations were unable to advance to full-scale development. In light of this, Dr. Wei-Tse Chang, founder of ALES Tech, decided in June 2019 to leave the Institute of Physics after nearly a decade of service. He established ALES Tech Inc. and obtained a patent license for the SAT technology from Academia Sinica. ALES Tech took on the task of commercializing the single-atom ion source to accelerate the development of next-generation FIB systems.
Since its founding, ALES Tech has focused on enhancing ion source performance and developing related patented technologies. Additionally, the company has advanced various metal tip-shaping techniques. Leveraging these derivative technologies, ALES has developed products such as nano-probes, micro-probes, and scanning probe microscopy (STM) tips. Among these, the Nano Probing System, used in advanced semiconductor processes for electrical measurements, relies on nanoscale metal tips to perform contact-based measurements on samples. ALES Tech proudly delivers the industry’s highest-specification nano-probes, catering to the needs of cutting-edge semiconductor manufacturing and analysis.
Since its founding, ALES Tech has focused on enhancing ion source performance and developing related patented technologies. Additionally, the company has advanced various metal tip-shaping techniques. Leveraging these derivative technologies, ALES has developed products such as nano-probes, micro-probes, and scanning probe microscopy (STM) tips. Among these, the Nano Probing System, used in advanced semiconductor processes for electrical measurements, relies on nanoscale metal tips to perform contact-based measurements on samples. ALES Tech proudly delivers the industry’s highest-specification nano-probes, catering to the needs of cutting-edge semiconductor manufacturing and analysis.
埃爾思科技股份有限公司
埃爾思科技股份有限公司
ALES TECH INC.
ALES TECH INC.
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